Diawuo, Kwesi. “Study of Hot-Carrier Induced Degradation in Delta-Doped and Conventional Mosfets. ”. Journal of Science and Technology 20, no. 1,2&3 (February 5, 2016). Accessed July 16, 2024. https://webapps.knust.edu.gh/just/index.php?journal=just&page=article&op=view&path[]=830.